March 11, 2011

Combining AFM with Time-Resolved Confocal Microscopy

Correlating nanometer-scale topography with fluorescence dynamics using the MicroTime 200

Structure and fluorescence do not exist independently at the nanoscale. Mechanical interaction can alter emission, and proximity can reshape photophysics. Observing both simultaneously requires more than sequential imaging.
Side-by-side AFM topography and fluorescence lifetime image of 100 nm fluorescent beads on glass, showing structural features in AFM and selective fluorescence contrast in FLIM.

When Structure and Photophysics Interact

At the nanometer scale, structure directly influences optical behavior. The presence of a metallic tip can quench fluorescence. Confinement of the electromagnetic field can enhance excitation. Mechanical interaction can alter molecular conformation and thus emission properties.

Atomic force microscopy (AFM) captures topography and force. Time-resolved confocal microscopy captures fluorescence intensity and lifetime. What is often missing is the ability to observe these effects while they occur, in the same spatial coordinate system and under synchronized acquisition conditions.

Without this integration, structural and photophysical interpretations remain partially decoupled.

A Realized AFM–FLIM Integration on the MicroTime 200

The Technical Note describes how an AFM was physically and electronically integrated with the MicroTime 200 using its objective scanning configuration.

Key aspects include:

  • positioning the AFM directly on the inverted microscope platform
  • aligning the AFM tip with the confocal detection volume
  • inserting AFM line markers into the TCSPC time-tagged photon stream
  • reconstructing synchronized topography and fluorescence lifetime images
Schematic sketch and picture of the combined MicroTime 200 and AFM setup.
Schematic sketch and picture of the combined setup: The AFM along with its sample stage is mounted on the inverse microscope body of the MicroTime 200, which is configured for objective scanning. The sample is placed on the scanner of the AFM and the data acquisition of the MicroTime 200 is synchronized with the scanner movement by including corresponding electronic marker signal into the collected photon data stream.

The document does not stop at system architecture. It presents experimental demonstrations, including correlated imaging of fluorescent beads, tip-induced quenching of single molecules, and combined AFM–FLIM measurements on nanodiamonds

Methodological Implications

Combining AFM with time-resolved confocal detection changes the type of questions that can be addressed. Quenching effects can be spatially resolved relative to tip position. Lifetime variations can be analyzed alongside mechanical interaction. Nanometer-scale structure and fluorescence decay dynamics become part of a unified dataset.

For researchers working at the interface of photophysics, nanotechnology, and single-molecule analysis, this integration is not merely additive. It enables experiments that would otherwise require indirect interpretation.

Download the full Technical Note to examine the system design, synchronization approach, and experimental validation in detail.

Visit MicroTime 200 >

Options
Photo of Evangelos Sisamakis

Author

Evangelos Sisamakis

Product Manager, PicoQuant

Instrumentation

Featured Products

Explore the instruments relevant to this article.

Modular Confocal Microscope with Single Molecule Sensitivity
Single-molecule sensitivity and precision
Flexible experimental design
Customizable and open workflows
Long-term reliability and upgradeability
Sustainable system design
Expert-level application support
Further Reading

Author’s Articles

Info Request

Contact us

Please fill out the form below to request more information about our products and services. You may also use it to ask for pricing, availability, technical specifications, or any other details relevant to your inquiry. Our team will be happy to review your request and get in touch with you. If additional information is needed to process your inquiry, we will let you know.

* Required

Contact us

Please fill out the form below to request more information and prices about our product. Our team will be happy to review your request and get in touch with you. If additional information is needed to process your inquiry, we will let you know.

* Required