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Time-Resolved Photolumine­scence (TRPL) Imaging

Time-Resolved Photolumine­scence (TRPL) Imaging

Quantitative Imaging of Carrier Lifetimes and Recombination Dynamics in Materials

A time-resolved imaging technique for visualizing photoluminescence lifetimes and excited-state dynamics in materials.
Spatially resolved TRPL image recorded from sample B, showing photoluminescence intensity distribution along laser-patterned lines. The structured regions remain photoluminescent, indicating that the laser process modifies local photophysical properties rather than completely removing the emissive material.
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Mapping Carrier Dynamics with TRPL Imaging

What is TRPL Imaging?

Time-resolved photoluminescence (TRPL) imaging is a spatially resolved, non-invasive extension of the TRPL technique that measures photoluminescence (PL) decay dynamics across a sample. By determining PL lifetimes at each pixel, it reveals local variations in recombination dynamics, defect distributions, carrier diffusion, and material quality. Compared to steady-state photoluminescence, TRPL imaging combines temporal and spatial resolution to probe excited-state processes in detail. The technique is widely applied in materials science to investigate semiconductors, solar cells, light-emitting devices, nanostructures, and two-dimensional materials, supporting fundamental studies and device optimization.

TRPL imaging of CdTe wafers. Left: Intensity and lifetime images of a CdTe wafer before (a, d) and after thermal activation (b, e). Right: Statistical distribution of intensities (c) and lifetimes (e, f) before (blue) and after (green) thermal activation.TRPL imaging of CdTe wafers. Left: Intensity and lifetime images of a CdTe wafer before (a, d) and after thermal activation (b, e). Right: Statistical distribution of intensities (c) and lifetimes (e, f) before (blue) and after (green) thermal activation.

How does TRPL Imaging work?

In TRPL imaging, the sample is excited by short laser pulses, producing photoluminescence that decays over time. The emitted photons are detected with picosecond temporal resolution and spatially assigned to image pixels. Time-correlated single photon counting (TCSPC) is commonly used to record photon arrival times relative to each excitation pulse. Repeating this process builds a decay histogram for every pixel, from which spatially resolved photoluminescence lifetime maps are reconstructed, revealing local variations in excited-state dynamics.

SymphoTime 64 software interface for fluorescence lifetime imaging analysisSymphoTime 64: fluorescence lifetime imaging and correlation software.

TRPL Data & Analysis

TRPL imaging generates time-resolved photoluminescence decay curves for each image pixel. These decays are analyzed using monoexponential or multiexponential fitting to extract photoluminescence lifetimes and amplitude fractions. Lifetime maps visualize spatial variations in recombination dynamics, revealing defects, interfaces, or compositional heterogeneity. Fit-free methods such as intensity-weighted mean lifetimes or pattern-based classification facilitate rapid data interpretation. Quantitative TRPL imaging analysis enables direct comparison of local optoelectronic properties within complex materials.

PicoQuant software for TRPL Imaging analysis

PicoQuant’s SymphoTime 64 software enables intuitive TRPL Imaging data acquisition and decay analysis with integrated fitting in a single streamlined workflow.

Carrier diffusion maps with time-resolved photoluminescence decay curvesCarrier diffusion maps derived from time-resolved photoluminescence imaging. Decay curves from different regions of interest reveal spatial variations in recombination dynamics and enable extraction of diffusion-related parameters such as carrier diffusion length and diffusion coefficient.

Why use TRPL Imaging?

TRPL imaging provides unique insight into spatially heterogeneous excited-state dynamics that cannot be accessed with bulk spectroscopy. By directly mapping photoluminescence lifetimes, the technique enables quantitative analysis of recombination pathways, defect-related losses, and charge transport processes. TRPL imaging is particularly valuable for correlating structural features with functional properties in advanced materials. It supports materials optimization by linking microscopic lifetime variations to composition, processing conditions, and device performance.

Micro-PL upgrade combining a scanning microscope with a spectrometer for spatially resolved, time-resolved photoluminescence analysis.Micro-PL upgrade combining a scanning microscope with a spectrometer for spatially resolved, time-resolved photoluminescence analysis.

Instrumentation requirements for TRPL

Accurate TRPL imaging requires picosecond pulsed laser excitation, time-resolved single-photon detection, and precise synchronization electronics. High temporal resolution is essential to resolve fast photoluminescence decays, while stable scanning or imaging optics ensure spatial fidelity. Multi-channel TCSPC electronics enable efficient photon timing across image pixels. Equally important is the reliable optical and electronic communication between the spectrometer, microscope, and detection unit, as complex coupling and signal routing can strongly affect data quality. Together, these components form an integrated system capable of quantitative, spatially resolved photoluminescence lifetime imaging in materials science.

For Spectroscopy and Microscopy

Time-Resolved Photoluminescence Course

Intro course on time-resolved photoluminescence, covering methods, instrumentation, and data analysis.
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Time-resolved Photoluminescence Course
Flagship in Materials Science Microscopy

Solira – Time-Resolved Photolumine­scence Microscope

Simplify your materials characterization with one flexible TRPL microscope enabling multiple methods for precise and efficient analysis.
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Simplify your materials characterization with one flexible TRPL microscope enabling multiple methods for precise and efficient analysis.
Photoluminescence Measurements

Compact Wavelength Selection with FlexLambda Kit

Software-controlled wavelength selector for visible and NIR spectral range, high transmission rate for highest sensitivity, compatible with widefield and confocal microscopes.
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FlexLambda Kit: Compact Wavelength Selection Unit
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Time-resolved photoluminescence emission spectrum with three peaks from different layers. Adapted from Buschmann et al., J Appl Spectrosc 80, 449–457 (2013).
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Application Examples

The following examples demonstrate how time-resolved photoluminescence imaging enables spatially resolved analysis of carrier dynamics, recombination processes, and material quality in advanced semiconductor systems.

Spatially resolved TRPL image recorded from sample B, showing photoluminescence intensity distribution along laser-patterned lines. The structured regions remain photoluminescent, indicating that the laser process modifies local photophysical properties rather than completely removing the emissive material.

Spatially Resolved TRPL Imaging of Laser-Patterned Perovskite Solar Mini Modules

Using the Solira time-resolved photoluminescence microscope, spatially resolved TRPL imaging reveals that laser-patterned regions in perovskite solar mini modules remain photoluminescent after laser structuring. Rather than completely removing the emissive material, the laser process modifies local photophysical properties and charge carrier dynamics. By combining localized TRPL measurements with spatial imaging in a single workflow, Solira enables a more comprehensive analysis of how device structuring affects semiconductor performance.

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Carrier diffusion maps with time-resolved photoluminescence decay curves

Non-Destructive TRPL Imaging of Photovoltaic Devices

Time-resolved photoluminescence imaging enables non-destructive investigation of photovoltaic devices with high spatial resolution. By combining confocal microscopy with spectroscopic detection, carrier diffusion, power-dependent recombination dynamics, and lifetime heterogeneity can be analyzed across semiconductor structures. The approach supports quantitative correlation of structural inhomogeneities with photophysical behavior in CIGS and other thin-film solar cell materials.

TRPL image following localized excitation at the center of the sample. Middle: Regions of interest with increasing distance from the excitation spot. Right: Normalized photoluminescence decay curves extracted from each region of interest, showing increasing average lifetimes due to carrier diffusion before recombination.

Carrier Diffusion in a GaAsP Quantum Well System

Time-resolved photoluminescence imaging of a GaAsP quantum well reveals spatially dependent carrier diffusion following localized excitation at 440 nm. Lifetime maps show increasing average lifetimes with radial distance from the excitation center, while decay analysis indicates diffusion-limited rise dynamics. Measurements were performed using an Olympus FluoView FV1000 equipped with PicoQuant’s LSM Upgrade Kit.

TRPL imaging of CdTe wafers. Left: Intensity and lifetime images of a CdTe wafer before (a, d) and after thermal activation (b,e). Right: Statistical distribution of intensities (c) and lifetimes (e, f) before (blue) and after (green) thermal activation.

Thermal Activation Effects in CdTe Polycrystalline Wafers

TRPL imaging of CdTe polycrystalline wafers before and after chloride-based thermal activation demonstrates significant increases in photoluminescence intensity and carrier lifetime. Lifetime maps and statistical distributions reveal enhanced recombination dynamics and spatial heterogeneity with millisecond acquisition times. Measurements were conducted using PicoQuant’s MicroTime 100 Time-Resolved Photoluminescence Microsope.

Related Methods

oft-confinement processing of a sub-micrometer polymer film using a patterned PDMS stamp, illustrating controlled structuring and morphology formation after UV cross-linking. Taken form Feng et al., ACS Nano, 10, 1, 150-158 (2016).

Photoluminescence (PL) Imaging

A steady-state optical imaging technique that maps the emission intensity of a material under continuous excitation. PL imaging provides spatial information on electronic states, defect-related transitions, and overall optical quality, but it lacks temporal resolution and cannot resolve excited-state dynamics.

TRPL decay curves illustrating time-dependent photoluminescence and varying carrier lifetimes in advanced materials.

Time-Resolved Photoluminescence (TRPL)

A time-resolved spectroscopy technique that measures the temporal decay of photoluminescence following pulsed excitation. TRPL reveals recombination dynamics and excited-state lifetimes, but it lacks the spatial resolution achievable with TRPL imaging.

In-Depth Scientific Resources

Premium Resources

Access in-depth application notes and scientific posters with detailed methods, measurement data, and real-world use cases.

Application Note: Spatially Resolved TRPL Imaging

This application note demonstrates spatially resolved TRPL imaging of laser-patterned perovskite solar mini modules.

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Customer Video: Study of Defects in Metal Halide Perovskites

In this customer video, Prof. Jinsong Huang (University of North Carolina) discusses how electronic defects affect efficiency and stability in perovskite solar cells and how FLIM helps visualize their impact.

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Application Note: Measuring Steady-state and Time-Resolved Photoluminescence

Learn how time-resolved fluorescence techniques reveal excited-state dynamics and charge-carrier processes in materials.

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Poster: Photoluminescence Analysis of PV Devices

Poster on non-destructive photoluminescence analysis of PV devices using TRPL microscopy to study carrier dynamics, diffusion and material properties.

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Poster: Photoluminescence Studies

TRPL studies from ps to ms reveal multicolor excitation dynamics and long-lived luminescence processes in advanced materials

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Poster: Measuring Steady-state and TRPL

Measuring steady-state and TRPL of a thin film CIGS solar cell by a positionable, micrometer-sized observation volume

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Application Note: Time-Resolved Fluorescence Spectroscopy and Microscopy

How time-resolved fluorescence spectroscopy and microscopy reveal excited-state dynamics, defects, and charge-carrier processes

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Poster: TRPL of Up-Conversion Nanoparticle

TRPL reveals energy transfer processes, lifetimes, and spatially resolved optical properties

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Poster: TRPL Mapping

TRPL mapping of CIGS devices using a combination of a superconducting nanowire detector and a confocal microscope

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Scientific Insights & Resources

Latest Blog Articles

PicoQuant's Product Manager with Solirasolira-interview-with-product-manager
June 18, 2026

Inside Solira: Designing a Flexible TRPL Microscope for Materials Characterization

Spatially resolved TRPL image recorded from sample B, showing photoluminescence intensity distribution along laser-patterned lines. The structured regions remain photoluminescent, indicating that the laser process modifies local photophysical properties rather than completely removing the emissive material.
June 10, 2026

Why Point Measurements Are Not Enough for Structured Perovskite Devices

Time-resolved emission spectra showing wavelength-dependent luminescence decays in a semiconductor measured with TCSPC.
March 1, 2026

Measuring Carrier Lifetimes in Semiconductor Wafers

PicoQuant's Product Manager with Solirasolira-interview-with-product-manager
June 18, 2026

Inside Solira: Designing a Flexible TRPL Microscope for Materials Characterization

Spatially resolved TRPL image recorded from sample B, showing photoluminescence intensity distribution along laser-patterned lines. The structured regions remain photoluminescent, indicating that the laser process modifies local photophysical properties rather than completely removing the emissive material.
June 10, 2026

Why Point Measurements Are Not Enough for Structured Perovskite Devices

Time-resolved emission spectra showing wavelength-dependent luminescence decays in a semiconductor measured with TCSPC.
March 1, 2026

Measuring Carrier Lifetimes in Semiconductor Wafers

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Time-resolved photoluminescence imaging (TRPL imaging) is a technique that maps photoluminescence lifetimes across a sample with spatial resolution. By measuring how photoluminescence decays at each image pixel, it reveals local variations in carrier dynamics, recombination processes, and material properties.

TRPL imaging combines pulsed laser excitation with time-resolved single-photon detection. Using time-correlated single photon counting (TCSPC), photon arrival times are recorded for each image pixel, allowing spatially resolved photoluminescence lifetime maps to be reconstructed from the measured decay curves.

TRPL imaging requires the integration of microscopy, wavelength-selective detection, and time-resolved photon counting within a single measurement workflow. Systems such as Solira combine these capabilities into one platform, enabling spatially resolved photoluminescence lifetime imaging under consistent measurement conditions. Wavelength selection can be performed using FlexLambda, while a FluoTime 300 spectrometer can be intergrated to provide additional characterization techniques, including absolute and relative photoluminescence quantum yield (PLQY) measurements using an integrating sphere and time-resolved emission spectra (TRES).

Steady-state photoluminescence imaging shows where emission occurs, but it does not provide information about emission dynamics. TRPL imaging adds temporal resolution by measuring photoluminescence lifetimes, enabling researchers to identify recombination pathways, carrier trapping, and local variations in excited-state behavior.

TRPL imaging can visualize how charge carriers move through a material after localized excitation. By analyzing lifetime maps and position-dependent decay curves, researchers can investigate diffusion processes, carrier transport, and the influence of defects or interfaces on carrier motion.

TRPL imaging is applied to a wide range of optoelectronic materials, including semiconductors, solar cells, LEDs, nanomaterials, polymers, and two-dimensional (2D) materials. By mapping photoluminescence lifetimes across a sample, the technique reveals local variations in carrier dynamics, recombination behavior, and material quality.

TRPL imaging is often combined with photoluminescence (PL) spectroscopy and localized TRPL measurements. PL spectroscopy identifies the relevant emission wavelengths and optical properties of a material, while point-based TRPL measurements provide detailed decay analysis at selected locations. TRPL imaging then extends this information across the sample, revealing spatial variations in carrier dynamics and recombination behavior.

Download the application note to see how this workflow is used to investigate laser-patterned perovskite solar mini modules.

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