Electroluminescence (EL)

Electroluminescence (EL) is an optical characterization technique in which light emission is generated by electrical excitation of a material or device. Under an applied bias, injected charge carriers recombine radiatively, producing photons whose spectral and spatial characteristics reveal the material’s electronic and structural properties. EL measurements are widely employed in the analysis of LEDs, solar cells, and other optoelectronic devices, offering direct insight into charge transport, recombination dynamics, and inhomogeneities under real operating conditions.

In an electroluminescence (EL) experiment, an electrical voltage or current is applied to a device, driving electrons and holes into the active material layer. When these charge carriers recombine radiatively, photons are emitted. The emitted light is collected and analyzed spectrally, temporally, or spatially to probe the material’s optoelectronic properties. EL measurements can be performed under steady-state or time-resolved conditions, enabling quantitative insights into recombination dynamics, emission efficiency, and spatial uniformity of device performance.

Electroluminescence (EL) data typically comprise emission spectra, intensity maps, and time-resolved decay traces. Spectral analysis reveals key optoelectronic features such as bandgap energy, defect-related emission, and carrier recombination pathways. Spatially resolved EL imaging identifies inhomogeneities including defects, non-uniform current injection, or degradation sites. Time-resolved EL provides access to carrier lifetimes and recombination dynamics under electrical excitation. Quantitative analysis often correlates EL intensity and spectra with applied bias, current density, or temperature to extract device-relevant parameters.

PicoQuant’s EasyTau 2 software enables intuitive TRPL data acquisition and decay analysis, with integrated fitting, reconvolution, and batch processing tools in a single streamlined workflow.