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Time-Resolved Photoluminescence (TRPL) Imaging

Time-Resolved Photoluminescence (TRPL) Imaging

Quantitative Imaging of Carrier Lifetimes and Recombination Dynamics in Materials

A time-resolved imaging technique for visualizing photoluminescence lifetimes and excited-state dynamics in materials.
Time-resolved photoluminescence image and decay curves of a CIGS solar cell measured using superconducting nanowire single-photon detectors revealing defect-related recombination dynamics.
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Mapping Carrier Dynamics with TRPL Imaging

What is TRPL Imaging?

Time-resolved photoluminescence (TRPL) imaging is a spatially resolved, non-invasive extension of the TRPL technique that measures photoluminescence (PL) decay dynamics across a sample. By determining PL lifetimes at each pixel, it reveals local variations in recombination dynamics, defect distributions, carrier diffusion, and material quality. Compared to steady-state photoluminescence, TRPL imaging combines temporal and spatial resolution to probe excited-state processes in detail. The technique is widely applied in materials science to investigate semiconductors, solar cells, light-emitting devices, nanostructures, and two-dimensional materials, supporting fundamental studies and device optimization.

TRPL imaging of CdTe wafers. Left: Intensity and lifetime images of a CdTe wafer before (a, d) and after thermal activation (b, e). Right: Statistical distribution of intensities (c) and lifetimes (e, f) before (blue) and after (green) thermal activation.

How does TRPL Imaging work?

In TRPL imaging, the sample is excited by short laser pulses, producing photoluminescence that decays over time. The emitted photons are detected with picosecond temporal resolution and spatially assigned to image pixels. Time-Correlated Single Photon Counting (TCSPC) is commonly used to record photon arrival times relative to each excitation pulse. Repeating this process builds a decay histogram for every pixel, from which spatially resolved photoluminescence lifetime maps are reconstructed, revealing local variations in excited-state dynamics.

SymphoTime 64: fluorescence lifetime imaging and correlation software.

TRPL Data & Analysis

TRPL imaging generates time-resolved photoluminescence decay curves for each image pixel. These decays are analyzed using monoexponential or multiexponential fitting to extract photoluminescence lifetimes and amplitude fractions. Lifetime maps visualize spatial variations in recombination dynamics, revealing defects, interfaces, or compositional heterogeneity. Fit-free methods such as intensity-weighted mean lifetimes or pattern-based classification facilitate rapid data interpretation. Quantitative TRPL imaging analysis enables direct comparison of local optoelectronic properties within complex materials.

PicoQuant software for TRPL Imaging analysis

PicoQuant’s SymphoTime 64 software enables intuitive TRPL Imaging data acquisition and decay analysis with integrated fitting in a single streamlined workflow.

Carrier diffusion maps derived from time-resolved photoluminescence imaging. Decay curves from different regions of interest reveal spatial variations in recombination dynamics and enable extraction of diffusion-related parameters such as carrier diffusion length and diffusion coefficient.

Why use TRPL Imaging?

TRPL imaging provides unique insight into spatially heterogeneous excited-state dynamics that cannot be accessed with bulk spectroscopy. By directly mapping photoluminescence lifetimes, the technique enables quantitative analysis of recombination pathways, defect-related losses, and charge transport processes. TRPL imaging is particularly valuable for correlating structural features with functional properties in advanced materials. It supports materials optimization by linking microscopic lifetime variations to composition, processing conditions, and device performance.

Micro-PL upgrade combining a scanning microscope with a spectrometer for spatially resolved, time-resolved photoluminescence analysis.

Instrumentation requirements for TRPL

Accurate TRPL imaging requires picosecond pulsed laser excitation, time-resolved single-photon detection, and precise synchronization electronics. High temporal resolution is essential to resolve fast photoluminescence decays, while stable scanning or imaging optics ensure spatial fidelity. Multi-channel TCSPC electronics enable efficient photon timing across image pixels. Equally important is the reliable optical and electronic communication between the spectrometer, microscope, and detection unit, as complex coupling and signal routing can strongly affect data quality. Together, these components form an integrated system capable of quantitative, spatially resolved photoluminescence lifetime imaging in materials science.

Photoluminescence Measurements

Compact Wavelength Selection with FlexLambda Kit

Software-controlled wavelength selector for visible and NIR spectral range, high transmission rate for highest sensitivity, compatible with widefield and confocal microscopes.
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FlexLambda Kit: Compact Wavelength Selection Unit
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Time-resolved photoluminescence emission spectrum showing three peaks from different semiconductor layers, illustrating layer-specific recombination dynamics.
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Application Examples

The following examples demonstrate how time-resolved photoluminescence imaging enables spatially resolved analysis of carrier dynamics, recombination processes, and material quality in advanced semiconductor systems.

Time-resolved photoluminescence image and decay curves of a CIGS solar cell measured using superconducting nanowire single-photon detectors revealing defect-related recombination dynamics.

TRPL Mapping of CIGS Devices Using SNSPD Detectors

Time-resolved photoluminescence (TRPL) imaging of weakly luminescent CIGS solar cells demonstrates the impact of detector sensitivity on spatially resolved carrier lifetime analysis. By combining a MicroTime 100 confocal microscope with superconducting nanowire single-photon detectors (SNSPDs) and HydraHarp TCSPC electronics, defect-related recombination dynamics and sub-nanosecond decay components are resolved with high signal-to-noise ratio in the near-infrared spectral range.

Carrier diffusion maps with time-resolved photoluminescence decay curves

Non-Destructive TRPL Imaging of Photovoltaic Devices

Time-resolved photoluminescence imaging enables non-destructive investigation of photovoltaic devices with high spatial resolution. By combining confocal microscopy with spectroscopic detection, carrier diffusion, power-dependent recombination dynamics, and lifetime heterogeneity can be analyzed across semiconductor structures. The approach supports quantitative correlation of structural inhomogeneities with photophysical behavior in CIGS and other thin-film solar cell materials.

Time-resolved photoluminescence image and decay curves showing charge carrier diffusion across a semiconductor sample after localized excitation.

Carrier Diffusion in a GaAsP Quantum Well System

Time-resolved photoluminescence imaging of a GaAsP quantum well reveals spatially dependent carrier diffusion following localized excitation at 440 nm. Lifetime maps show increasing average lifetimes with radial distance from the excitation center, while decay analysis indicates diffusion-limited rise dynamics. Measurements were performed using an Olympus FluoView FV1000 equipped with PicoQuant’s LSM Upgrade Kit.

TRPL intensity and lifetime imaging of CdTe wafers before and after thermal activation

Thermal Activation Effects in CdTe Polycrystalline Wafers

TRPL imaging of CdTe polycrystalline wafers before and after chloride-based thermal activation demonstrates significant increases in photoluminescence intensity and carrier lifetime. Lifetime maps and statistical distributions reveal enhanced recombination dynamics and spatial heterogeneity with millisecond acquisition times. Measurements were conducted using PicoQuant’s MicroTime 100 Time-Resolved Photoluminescence Microsope.

Related Methods

Excitation and emission spectra of fluorescence polymer reference materials SFG and SFO measured with a microscope-based photoluminescence setup.

Photoluminescence (PL) Imaging

A steady-state optical imaging technique that maps the emission intensity of a material under continuous excitation. PL imaging provides spatial information on electronic states, defect-related transitions, and overall optical quality, but it lacks temporal resolution and cannot resolve excited-state dynamics.

TRPL decay curves showing different lifetimes

Time-Resolved Photoluminescence (TRPL)

A time-resolved spectroscopy technique that measures the temporal decay of photoluminescence following pulsed excitation. TRPL reveals recombination dynamics and excited-state lifetimes, but it lacks the spatial resolution achievable with TRPL imaging.

In-Depth Scientific Resources

Premium Resources

Access in-depth application notes and scientific posters with detailed methods, measurement data, and real-world use cases.

Customer Video: Study of Defects in Metal Halide Perovskites

In this customer video, Prof. Jinsong Huang (University of North Carolina) discusses how electronic defects affect efficiency and stability in perovskite solar cells and how FLIM helps visualize their impact.

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Application Note: Measuring Steady-state and Time-Resolved Photoluminescence

Learn how time-resolved fluorescence techniques reveal excited-state dynamics and charge-carrier processes in materials.

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Poster: Photoluminescence Analysis of PV Devices

Poster on non-destructive photoluminescence analysis of PV devices using TRPL microscopy to study carrier dynamics, diffusion and material properties.

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Poster: Photoluminescence Studies

TRPL studies from ps to ms reveal multicolor excitation dynamics and long-lived luminescence processes in advanced materials

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Poster: Measuring Steady-state and TRPL

Measuring steady-state and TRPL of a thin film CIGS solar cell by a positionable, micrometer-sized observation volume

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Application Note: Time-Resolved Fluorescence Spectroscopy and Microscopy

How time-resolved fluorescence spectroscopy and microscopy reveal excited-state dynamics, defects, and charge-carrier processes

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Poster: TRPL of Up-Conversion Nanoparticle

TRPL reveals energy transfer processes, lifetimes, and spatially resolved optical properties

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Poster: TRPL Mapping

TRPL mapping of CIGS devices using a combination of a superconducting nanowire detector and a confocal microscope

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