We are launching Solira, our new microscope for time-resolved photoluminescence (TRPL) measurements and advanced materials characterization, introduced to the public for the first time at the E-MRS Spring Meeting 2026 in Strasbourg, France (May 25–29, 2026). Combining methods such as TRPL, TRPL imaging, carrier diffusion mapping, and correlation measurements within one configurable system, Solira enables the investigation of semiconductors, perovskites, nanomaterials, LEDs, quantum emitters, and other advanced material systems.
Key Benefits
- All-in-one material characterization
- Flexible measurement configurations
- Single-emitter sensitivity
- Scalable system design
- Reduced experimental complexity
- Expert-level application support
Flexibility meets Sensitivity
Modern materials research increasingly requires the combination of spatial, temporal, and spectral information across different sample types and experimental conditions. Solira addresses these challenges through flexible excitation and detection configurations combined with high sensitivity for weak emission signals and fast photophysical processes. Configurations with up to 8 laser channels covering excitation wavelengths from 355 nm to 1064 nm support measurements across diverse material systems, while flexible detector configurations with spectral sensitivity from 400 nm to 1550 nm enable reliable characterization of demanding samples. PicoQuant’s proven time tagging and TCSPC electronics provide picosecond timing precision for studying charge carrier dynamics, recombination pathways, excited-state behavior, and single-emitter properties.
Expanding Our Instrumentation Portfolio for Time-Resolved Research
With Solira, we’re expanding our portfolio of advanced instrumentation for time-resolved spectroscopy and microscopy. Whether your work focuses on semiconductor characterization, perovskite research, nanomaterials, or quantum photonics, Solira gives you the tools to investigate complex photophysical processes across the full breadth of contemporary material systems.