PicoQuant introduces the new version of the Semiconductor Wafer Analysis System WaferCheck 150. For high quality semiconductor devices such as heterojunction bipolar transistors, sensitive photodetectors, photovoltaic collectors, solar cells, efficient laser diodes or bright light emitting diodes, a precise measurement of the material characteristics is required. Among a variety of possible parameter to be tested, the electron-hole recombination rate is perhaps the most important one.
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